PJB-2020-447
MOLECULAR CHARACTERIZATION OF WHEAT EXOTIC LINES FOR LEAF RUST RESISTANCE USING DIFFERENT SSR MARKERS
NUMAN AHMAD
Abstract
Leaf rust has been reported to be the most spreadable and critical disease of wheat (Triticum aestivum L) that results in significant loss in yield of wheat worldwide. Thirty-four (34) wheat exotic advanced lines were characterized for leaf rust using nine (9) Polymorphic Simple Sequence Repeat (SSRs) primers i.e., Lr24, Lr26, Lr28, Lr32, Lr34, Lr36, Lr37, Lr39 and Lr46. Out of nine (09) SSRs markers, six (06) markers produced reproducible bands. The highest frequency observed was 94.11% in case of four (04) markers i.e., Lr24, Lr34, Lr37 and Lr46, which was detected in 32 wheat lines that cause resistance against leaf rust. While the lowest frequency recorded was 91.17% from two (02) markers i.e., Lr28, Lr32, which was observed in 31 wheat lines and was found absent in the remaining lines. All the six primers were observed in almost all the lines except one line i.e. (RS2), which is about 2.94% of the studied lines/population. The coefficient of similarity based on six primers ranged from 0.0 to 1.3, in 34 wheat lines the dissimilarity is less which is efficiently managed by breeding program. The dendrogram was constructed by using SAS software (neighbor joining method) on the bases of molecular data that divided wheat lines in to two clusters i.e. Group 1 and 2. Group 1 collectively comprised of 28 lines was sub divided into two sub groups such as sub group I and II. Sub group I consisted of 23 lines, while sub group II consisted of 5 lines. Similarly, group 2 comprised of 6 lines. The identification of leaf rust resistant varieties/lines will help in strengthening the future wheat breeding program and will expectedly reduce the threat of yield loss due to leaf rust.
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