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GENETIC CHARACTERISATION OF GAMMA IRRADIATION INDUCED LEAF MUTATIONS IN MUNG BEAN (VIGNA RADI A TA (L) WILCZEK)
Abstract
Three new leaf mutants, serrated leaf, unifoliate and narrow leaf were induced in mung bean, Vigna radiata (L) Wilczek, following seed treatments with different exposures of gamma irradiation. The serrated leaf mutant was obtained in cultivar Fak 32 at 60 KR whereas unifoliate and narrow leaf mutants were obtained in cultivar 6601 at 30 KR and 60 KR doses, respectively, in the M2 generation. The serrated leaf mutant had relatively large thick leaflets with conspicuous deep serration of the margins as compared to the entire leaflets of the parent. The pollen fertility in the mutant lines ranged from 42-95%. The mutant behaved as monogenic recessive to normal. The gene symbols Sl/sl are proposed for this allelic pair. The unifoliate mutant was characterised by simple leaves instead of trifoliates whereas the narrow leaf
